Baltimore, MD, United States of America

Dung-Han Lee

This inventor holds 1 USPTO granted patent. Top assignee: Aurora Operations, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dung-Han Lee. Retrieved from https://idiyas.com/inventor/dung-han-lee-ecixibo7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Dung-Han Lee and Autonomous Vehicle Innovation.

Introduction

Dung-Han Lee is an inventor associated with Aurora Operations, Inc., in Baltimore, Maryland. His patent work addresses longitudinal bias correction for autonomous vehicles, helping vehicle systems better align sensor data with mapped surroundings.

Latest Patents

Lee is named on 1 patent, titled “Longitudinal Bias Correction in Autonomous Vehicles.” The disclosed method obtains a LIDAR scan describing the vehicle’s environment and a surfel map of that environment. It classifies scan points as explained or unexplained according to whether they match surfels in the map. The method then shifts the scan along the longitudinal direction over multiple iterations, determines a longitudinal bias for each iteration, and uses the resulting bias to perform an operation for the autonomous vehicle.

Career Highlights

Lee’s identified patent reflects work on sensor alignment and bias estimation, important technical challenges in autonomous vehicle perception. The method uses comparisons between LIDAR measurements and mapped environmental features to inform vehicle operations.

Collaborations

The patent is associated with Aurora Operations, Inc., a company working in autonomous vehicle technology. The available information identifies Lee and the company but does not specify additional collaborators.

Conclusion

Dung-Han Lee’s patent focuses on improving autonomous vehicle operations by estimating and correcting longitudinal bias through LIDAR scan alignment with a surfel map.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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