Ithaca, NY, United States of America

Duncan Anderson

This inventor holds 1 USPTO granted patent. Top assignee: S&p Global Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Duncan Anderson. Retrieved from https://idiyas.com/inventor/duncan-anderson-md539gj1

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Duncan Anderson and Data Forecasting for Electrical Substations

Introduction

Duncan Anderson is an inventor associated with Ithaca, New York, and S&P Global Inc. His patent work addresses forecasting electrical-rate fluctuations and deviations across nodes in electrical grids.

Latest Patents

Anderson is credited with 1 patent, titled “Data Forecast for Substations in Electrical Grids.” The patent describes a computer-implemented method that selects grid nodes and filters anomalous observations from each node’s historical data to create refined datasets. Computational models are trained on those datasets to forecast electrical-rate deviations and fluctuations, and each model receives a composite performance score. A stochastic model also estimates anomalous electrical-rate fluctuations, which are incorporated into forecasts for a specified period.

Career Highlights

Anderson’s listed patent reflects work at the intersection of machine learning, anomaly analysis, and electrical-grid forecasting. The method combines historical data refinement, model evaluation, and stochastic estimation to produce forecasts for multiple grid nodes.

Collaborations

Anderson’s listed coworkers include Oscar Vasquez and Nikita Sharma. The available information does not specify their roles in the patent or their contributions to its development.

Conclusion

Duncan Anderson’s patent describes a data-driven approach to forecasting electrical-rate behavior at substations, combining machine learning and stochastic modeling to support analysis of grid fluctuations and deviations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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