Los Gatos, CA, United States of America

Duane E Johnson

This inventor holds 2 USPTO granted patents. Top assignee: International Business Machines Corporation. Active years: 1976-1978.


% Patents Active = 100.0

Average Co-Inventor Count = 2.9

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 1976-1978

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2 patents (USPTO):Explore Patents

Title: Duane E Johnson: Innovator in Electron Beam Resists

Introduction

Duane E Johnson is a notable inventor based in Los Gatos, CA (US). He has made significant contributions to the field of electron beam resists, holding a total of 2 patents. His work has advanced the technology used in various applications, showcasing his expertise and innovative spirit.

Latest Patents

Johnson's latest patents include a process for preparing electron beam resists. This process involves reacting a film that is a copolymer of methyl methacrylate and methacrylic acid with a tertiary amine. Another significant patent focuses on positive polymeric electron beam resists, where it has been discovered that the sensitivity of these resists can be increased by using polymers with a molecular weight of at least one million. This advancement allows for a reduction in the required radiation to below 3 × 10-6 coulombs/cm2.

Career Highlights

Duane E Johnson has had a distinguished career, primarily working with International Business Machines Corporation (IBM). His innovative work in the field of electron beam resists has positioned him as a key figure in the industry.

Collaborations

Throughout his career, Johnson has collaborated with notable coworkers such as Wayne Martin Moreau and Charles A Cortellino. These collaborations have contributed to the advancement of technology in their respective fields.

Conclusion

Duane E Johnson's contributions to the field of electron beam resists demonstrate his innovative capabilities and commitment to advancing technology. His patents reflect a deep understanding of materials and processes that are crucial for future developments in this area.

Profile summary based on public USPTO records.
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