Company Filing History:
Years Active: 2023
Title: Duane Clifford Karns: Innovator in Complex Permittivity Measurements
Introduction
Duane Clifford Karns is a notable inventor based in Mays Landing, NJ (US). He has made significant contributions to the field of measurement technology, particularly in the area of complex permittivity measurements. His innovative approach has led to the development of a unique patent that enhances the accuracy and efficiency of measuring materials.
Latest Patents
Karns holds a patent for a "Resonant waveguide cavity system for complex permittivity measurements." This invention describes a method of using a resonant cavity to measure complex permittivity (ε) and identify samples, whether solid or liquid, with microliter volume sizes. The process involves utilizing a network analyzer to measure a first resonance frequency at a cavity resonance mode over a defined millimeter wave frequency range. It also includes calculating an unloaded quality factor of the resonant waveguide cavity, placing a sample on the bottom wall of the cavity, measuring a second resonance frequency, and determining a resonance frequency shift (Δf). The complex permittivity of the sample is then calculated based on these measurements, allowing for precise identification through a database.
Career Highlights
Duane Karns is associated with the Battelle Memorial Institute, where he applies his expertise in measurement technology. His work has been instrumental in advancing the capabilities of complex permittivity measurements, which are crucial in various scientific and industrial applications.
Collaborations
Karns has collaborated with notable colleagues, including James Christopher Weatherall and Jeffrey Brian Barber. Their combined efforts have contributed to the development of innovative solutions in the field of measurement technology.
Conclusion
Duane Clifford Karns is a distinguished inventor whose work in complex permittivity measurements has made a significant impact in the field. His patent and collaborations reflect his commitment to advancing measurement technology.