The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Sep. 18, 2020
Applicant:

Battelle Memorial Institute, Columbus, OH (US);

Inventors:

Duane Clifford Karns, Mays Landing, NJ (US);

James Christopher Weatherall, Linwood, NJ (US);

Jeffrey Brian Barber, Vineland, NJ (US);

Barry Thomas Smith, Egg Harbor City, NJ (US);

Zachary J. Landicini, Vineland, NJ (US);

Assignee:

Battelle Memorial Institute, Columbus, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 22/00 (2006.01); H01P 7/06 (2006.01);
U.S. Cl.
CPC ...
G01N 22/00 (2013.01); H01P 7/06 (2013.01);
Abstract

A method of using a resonant cavity for measuring a complex permittivity ε and identifying of a sample (solid or liquid) of microliter volume size includes using a network analyzer to measure over a defined millimeter wave frequency range, a first resonance frequency at a cavity resonance mode, and calculating an unloaded quality factor of an enclosed resonant waveguide cavity of a defined internal dimensions, placing a sample on a surface of a bottom wall of the resonant waveguide cavity and measure a second resonance frequency and calculating a loaded quality factor; determining, a resonance frequency shift Δf=(f−f), determining a complex permittivity ε of the sample according to the resonance frequency shift Δf, the loaded quality factor, the unloaded quality factor and the defined internal dimensions; and identifying the sample using a database through the complex permittivity ε.


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