Châtenay-Malabry, France

Driss Bouami

This inventor holds 1 USPTO granted patent. Top assignee: Ecole Centrale Des Arts Et Manufactures. Active years: 1988.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Driss Bouami. Retrieved from https://idiyas.com/inventor/driss-bouami

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 1988

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1 patent (USPTO):Explore Patents

Title: Driss Bouami: Innovator in Non-Destructive Testing

Introduction

Driss Bouami is a notable inventor based in Châtenay-Malabry, France. He has made significant contributions to the field of non-destructive testing, particularly with his innovative methods for assessing structural integrity.

Latest Patents

Driss Bouami holds a patent for a non-destructive method for determining at least one point of a crack. This invention is crucial for ensuring the safety and reliability of various structures without causing any damage during the assessment process. He has 1 patent to his name.

Career Highlights

Driss Bouami is affiliated with the École Centrale des Arts et Manufactures, where he applies his expertise in engineering and innovation. His work focuses on developing advanced techniques that enhance the safety and durability of materials used in construction and manufacturing.

Collaborations

Driss collaborates with his coworker, Daniel De Vadder, to further explore innovative solutions in their field. Their combined efforts aim to push the boundaries of what is possible in non-destructive testing.

Conclusion

Driss Bouami's contributions to non-destructive testing exemplify the importance of innovation in engineering. His work not only advances technology but also ensures the safety of structures worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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