Rochester, MN, United States of America

Drew C Varner

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: International Business Machines Corporation. Active years: 2020.

USPTO Granted Patents = 1 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Drew C Varner

Introduction

Drew C Varner is a notable inventor based in Rochester, MN (US). He has made significant contributions to the field of technology, particularly through his innovative patent. His work reflects a deep understanding of computer systems and their interactions.

Latest Patents

Drew C Varner holds a patent titled "Using and comparing known and current activity states to determine receptiveness." This computer-implemented method involves identifying both a sending and a receiving computer system. The process includes receiving a request for a receptiveness value, which indicates the openness of the receiving system to interruptions. The method further analyzes the current and known states of the receiving system to calculate the receptiveness value. This innovative approach enhances communication efficiency between computer systems.

Career Highlights

Drew C Varner is associated with International Business Machines Corporation, commonly known as IBM. His role at IBM allows him to work on cutting-edge technology and contribute to advancements in the field. His patent showcases his ability to merge theoretical concepts with practical applications.

Collaborations

Drew has collaborated with notable colleagues, including James E Carey and Bradley L Manning. These partnerships have likely enriched his work and fostered a collaborative environment for innovation.

Conclusion

Drew C Varner's contributions to technology through his patent demonstrate his innovative spirit and expertise in computer systems. His work at IBM and collaborations with esteemed colleagues further highlight his impact in the field.

Profile summary based on public USPTO records.
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