Harvard, MA, United States of America

Douglas J Chabinsky

This inventor holds 1 USPTO granted patent. Top assignee: Honeywell G.m.b.h.. Active years: 1983.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Douglas J Chabinsky. Retrieved from https://idiyas.com/inventor/douglas-j-chabinsky

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 37(Granted Patents)


Company Filing History:


Years Active: 1983

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1 patent (USPTO):Explore Patents

Title: Douglas J Chabinsky: Innovator in Infrared Calibration Technology

Introduction

Douglas J Chabinsky is a notable inventor based in Harvard, MA (US). He has made significant contributions to the field of infrared calibration technology. His innovative work has led to the development of a unique patent that enhances the accuracy of infrared detectors.

Latest Patents

Chabinsky holds a patent for a "Miniature thin film infrared calibration source." This invention features an evaporated thin-film platinum resistance thermometer interleaved with a nichrome heating element on a sapphire substrate. This design allows for the calibration of infrared detectors and enables precise control of the output signals of such detectors.

Career Highlights

Chabinsky is associated with Honeywell GmbH, where he applies his expertise in developing advanced calibration technologies. His work has been instrumental in improving the performance of infrared detection systems.

Collaborations

Chabinsky has collaborated with Roger C Coda, contributing to the advancement of their shared projects in infrared technology.

Conclusion

Douglas J Chabinsky's innovative contributions to infrared calibration technology exemplify the impact of dedicated inventors in enhancing technological accuracy and efficiency. His work continues to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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