Douglas A Asbury

Title: Douglas A. Asbury: Innovator in Semiconductor Testing

Introduction

Douglas A. Asbury is a notable inventor based in Chapel Hill, NC (US). He has made significant contributions to the field of semiconductor technology. His innovative approach has led to the development of a unique method for testing semiconductor devices.

Latest Patents

Douglas A. Asbury holds 1 patent for a system and method for accelerated degradation testing of semiconductors. This patent describes a method of testing a semiconductor device by pulsing it with a predetermined level of current for a specific duration. This process causes inadequate parts to degrade while allowing adequate parts to stabilize. The method also includes measuring predetermined electrical or optical performance characteristics of the semiconductor device after the current pulse. Additionally, the patent outlines a system for testing semiconductor devices on a wafer, which includes a contact probe for applying current pulses and measuring means for assessing performance characteristics.

Career Highlights

Douglas A. Asbury is associated with Cree Research Inc., a company known for its advancements in semiconductor technology. His work at Cree Research Inc. has positioned him as a key player in the development of innovative testing methods for semiconductor devices.

Collaborations

Some of his notable coworkers include John Adam Edmond and Calvin H. Carter, Jr. Their collaboration has likely contributed to the advancements in semiconductor testing methodologies.

Conclusion

Douglas A. Asbury's contributions to semiconductor testing reflect his innovative spirit and dedication to advancing technology. His patent for accelerated degradation testing is a testament to his expertise in the field.