Maumee, OH, United States of America

Doug Struble

This inventor holds 1 USPTO granted patent. Top assignee: Graham Packaging Company, L.p.. Active years: 2008.


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Doug Struble - Innovator in Pressure Resistant Technology

Introduction

Doug Struble is a notable inventor based in Maumee, Ohio. He has made significant contributions to the field of engineering with his innovative designs. His work primarily focuses on creating solutions that enhance the functionality and durability of various structures.

Latest Patents

Doug Struble holds a patent for a "Pressure Resistant Base." This invention features a base structure that includes a bearing surface defining a bearing plane. The inner portion of the base is spaced apart from the bearing surface in a direction that is substantially perpendicular to the bearing plane. It consists of a first surface, a second surface spaced apart from the first surface, and a step that merges the first surface with the second surface. This design aims to improve the stability and performance of the base under pressure.

Career Highlights

Doug Struble is currently employed at Graham Packaging Company, L.P., where he applies his expertise in engineering and innovation. His role involves developing new technologies that contribute to the company's success in the packaging industry.

Collaborations

Throughout his career, Doug has worked alongside talented individuals such as Debra Finnigan and Richard R. Johnston. These collaborations have fostered a creative environment that encourages the development of groundbreaking ideas.

Conclusion

Doug Struble's contributions to the field of engineering, particularly through his patent for a pressure resistant base, highlight his innovative spirit and dedication to improving structural designs. His work continues to influence the industry and inspire future inventors.

Profile summary based on public USPTO records.
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