This inventor holds 2 USPTO granted patents. Top assignee: Lsi Logic Corporation. Active years: 2006-2008.
Company Filing History:
Years Active: 2006-2008
Title: Doug Feist: Innovator in High-Speed Testing Technologies
Introduction
Doug Feist is a notable inventor based in Fort Collins, CO (US). He has made significant contributions to the field of testing technologies, particularly in the realm of high-speed testing for integrated circuits. With a total of 2 patents, Feist has developed innovative solutions that address current challenges in the industry.
Latest Patents
Feist's latest patents include "High-speed TDF testing on low cost testers using on-chip pulse generators and dual ATE references for rapidchip and ASIC devices." This invention facilitates TDF testing without the need for expensive new test equipment, allowing for test frequencies beyond the current 200 MHz limitation. The circuit he developed enables the device-under-test (DUT) to receive two reference clock signals from conventional automated test equipment (ATE), creating high-speed clock pulses for the TDF test sequence.
Another significant patent is the "Technique for measurement of programmable termination resistor networks on rapidchip and ASIC devices." This measurement technique eliminates error components by performing a differential-style measurement of the programmable termination resistor network. By taking multiple resistance measurements on the same DUT pin, Feist's method generates a differential resistance measurement that accurately reflects the on-chip DUT resistance, free from error components. This technique can be applied during both the wafer sort and package test phases of device testing.
Career Highlights
Doug Feist is currently employed at LSI Logic Corporation, where he continues to innovate in the field of testing technologies. His work has had a profound impact on the efficiency and accuracy of testing processes in the semiconductor industry.
Collaborations
Feist has collaborated with notable coworkers such as Kevin J Gearhardt and Anita Greeb, contributing to advancements in testing methodologies and technologies.
Conclusion
Doug Feist's contributions to high-speed testing technologies have established him as a key figure in the field. His innovative patents provide solutions that enhance the efficiency and effectiveness of testing processes in the semiconductor industry.