US

Doug Boone

This inventor holds 0 USPTO granted patents, plus 1 CIPO patent.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Doug Boone. Retrieved from https://idiyas.com/inventor/doug-boone-sginmvku

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

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Title: Doug Boone - Innovator in Computer-Based Testing Solutions.

Introduction

Doug Boone is an accomplished inventor based in the United States, known for his innovative contributions to the field of computer-based testing. He has developed a unique system and method that enhances the functionality of test driver applications, ensuring a seamless testing experience for candidates.

Latest Patents

Doug Boone holds a patent for a system and method for computer-based testing that utilizes cache and cacheable objects. This invention allows for the efficient delivery of computer-based tests to candidates while monitoring various performance metrics. The system is designed to adjust the delivery of test components based on real-time monitoring, ensuring that candidates can continue their assessments even in the event of network communication failures.

Career Highlights

Doug Boone is currently employed at Prometric Holdings LLC, where he applies his expertise in developing advanced testing solutions. His work focuses on improving the efficiency and reliability of computer-based assessments, making significant strides in the educational technology sector.

Collaborations

Doug has collaborated with notable colleagues, including Christopher Crowhurst and Roger C Kershaw, to further enhance the capabilities of testing systems and methodologies.

Conclusion

Doug Boone's innovative work in computer-based testing exemplifies the importance of technology in education. His contributions continue to shape the future of assessment methodologies, ensuring that candidates have a reliable and effective testing experience.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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