New York, NY, United States of America

Doron Feldman

This inventor holds 1 USPTO granted patent. Top assignee: Seetrue Screening Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Doron Feldman. Retrieved from https://idiyas.com/inventor/doron-feldman-jbltdusa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Doron Feldman: Inventor in Three-Dimensional Screening Technology.

Introduction

Doron Feldman is an inventor based in New York, NY (US), associated with Seetrue Screening Ltd. His work includes technology for detecting prohibited objects concealed within items through three-dimensional imaging.

Latest Patents

Feldman is named on 1 patent: “Detection of Prohibited Objects Concealed in an Item, Using a Three-Dimensional Image of the Item.” The patent describes systems and methods that obtain a three-dimensional representation of an item, with points carrying intensity values derived from imaging data. The system identifies a cluster corresponding to an object of interest and determines the object’s position and orientation. It then generates a two-dimensional representation oriented to help a detection algorithm, such as a machine-learning model, recognize the object as potentially prohibited.

Career Highlights

Feldman’s disclosed patent work focuses on applying three-dimensional imaging data to security screening. The described approach uses an object’s position and orientation to create a view intended to improve automated detection.

Collaborations

Feldman is associated with Seetrue Screening Ltd. His coworker is Assaf Frenkel.

Conclusion

Doron Feldman’s patent describes a three-dimensional imaging approach that transforms detected objects into views designed to support automated identification of prohibited items.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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