Qingdao, China

Dongyu Zhao

This inventor holds 1 USPTO granted patent. Top assignee: Crrc Qingdao Sifang Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dongyu Zhao. Retrieved from https://idiyas.com/inventor/dongyu-zhao-f61csqa8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Dongyu Zhao: Inventor of a Positioning and Speed-Measurement Testing Method

Introduction

Dongyu Zhao is an inventor based in Qingdao, China. His work includes a patented method and device for testing the main unit of a positioning and speed-measuring system.

Latest Patents

Zhao is associated with 1 patent, titled “Method and Device for Testing Positioning and Speed Measuring System Main Unit.” The invention simulates signals from absolute and relative position sensors and sends them to the system’s main unit. It then compares the result calculated by the unit with a reference result for the same simulated signal. If the difference exceeds a preset range, the main unit is determined to be abnormal.

This approach allows the main unit to be tested without physical absolute and relative position sensors. It is designed to simplify testing and make it possible to establish a test environment without substantial investment in large-scale equipment.

Career Highlights

Zhao is associated with CRRC Qingdao Sifang Co., Ltd. His patent describes a practical testing approach for evaluating positioning and speed-measuring system equipment.

Collaborations

Fengchao Wang and Fujie Jiang are identified as Zhao’s coworkers. The provided information does not specify their roles in the patent or whether they collaborated with him on the invention.

Conclusion

Dongyu Zhao’s patented testing method uses simulated sensor signals and reference-result comparisons to assess a system’s main unit, offering a simpler alternative to testing with physical sensors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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