Palo Alto, CA, United States of America

Dongxue Chen

This inventor holds 1 USPTO granted patent. Top assignee: Luminescent Technologies, Inc.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dongxue Chen. Retrieved from https://idiyas.com/inventor/dongxue-chen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Biography of Dongxue Chen

Introduction: Dongxue Chen is an accomplished inventor based in Palo Alto, California. He has made significant contributions to the field of electron-beam imaging technology.

Latest Patents: Dongxue Chen holds a patent for a technique titled "Electron-beam image reconstruction." This innovative method focuses on reconstructing an electron-beam (EB) image, which can be a scanning-electron-microscope (SEM) image or an EB-inspection image. The technique involves an inverse electro-optical calculation that corrects for the influence of an electro-optical transfer function associated with an EB system on the EB image. The model of the electro-optical transfer function may have an analytical derivative and can be represented by a closed-form expression.

Career Highlights: Dongxue Chen is currently employed at Luminescent Technologies, Inc., where he applies his expertise in electron-beam imaging. His work has contributed to advancements in imaging technology, enhancing the capabilities of electron-beam systems.

Collaborations: Throughout his career, Dongxue has collaborated with notable colleagues, including Changqing Hu and Linyong Pang. These collaborations have fostered innovation and development in their respective fields.

Conclusion: Dongxue Chen's contributions to electron-beam imaging technology and his innovative patent demonstrate his commitment to advancing scientific knowledge and technology. His work continues to influence

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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