Seongnam, South Korea

Dongwon Yoon

This inventor holds 1 USPTO granted patent. Top assignee: Naver Labs Corporation. Active years: 2021.


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Dongwon Yoon - Innovator in Indoor Autonomous Robotics

Introduction

Dongwon Yoon is a prominent inventor based in Seongnam, South Korea. He has made significant contributions to the field of robotics, particularly in the development of methods for controlling indoor autonomous robots. His innovative approach has the potential to enhance the efficiency and functionality of service robots in various environments.

Latest Patents

Dongwon Yoon holds a patent for a "Method and system for controlling indoor autonomous robot." This invention outlines a method of controlling an indoor autonomous driving of a robot within a cloud system. The process involves receiving first sensing data generated by a mapping robot, creating an indoor map of the target facility, and utilizing second sensing data from a service robot to control its autonomous driving based on the generated map.

Career Highlights

Dongwon Yoon is currently employed at Naver Labs Corporation, where he continues to push the boundaries of robotics technology. His work focuses on integrating cloud systems with autonomous robots, which is a crucial area of research in the modern technological landscape.

Collaborations

He collaborates with talented individuals such as Jinwon Chung and Sangok Seok, who contribute to the innovative projects at Naver Labs Corporation. Their teamwork fosters a creative environment that leads to groundbreaking advancements in robotics.

Conclusion

Dongwon Yoon's contributions to indoor autonomous robotics exemplify the innovative spirit of modern inventors. His patent and ongoing work at Naver Labs Corporation highlight the importance of collaboration and technological advancement in the field.

Profile summary based on public USPTO records.
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