Seoul, South Korea

Donggun Yoo

This inventor holds 1 USPTO granted patent. Top assignee: Infosys Limited. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Donggun Yoo. Retrieved from https://idiyas.com/inventor/donggun-yoo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Donggun Yoo - Innovator in Software Defect Prediction

Introduction

Donggun Yoo is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of software engineering, particularly in the area of defect prediction in computer programs. His innovative approach aims to enhance the reliability and quality of software applications.

Latest Patents

Donggun Yoo holds a patent for "Methods for predicting one or more defects in a computer program and devices thereof." This invention involves a method, a non-transitory computer-readable medium, and an apparatus that obtains a version history for a plurality of source code files associated with a computer program. The process generates defect probability values for each source code file using various metrics and the obtained version history. This allows for the identification of source code files that have a higher risk of containing defects, thereby improving software quality.

Career Highlights

Donggun Yoo is currently employed at Infosys Limited, where he continues to work on innovative solutions in software development. His expertise in defect prediction has positioned him as a valuable asset in the tech industry.

Collaborations

Some of his notable coworkers include Girish Maskeri Rama and Himanshu Tyagi, who collaborate with him on various projects at Infosys Limited.

Conclusion

Donggun Yoo's contributions to software defect prediction exemplify the importance of innovation in enhancing software reliability. His work not only benefits his company but also advances the field of software engineering as a whole.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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