Daejeon, South Korea

Donggeun Lee

This inventor holds 1 USPTO granted patent. Top assignees: Agency for Defense Development, Korea Advanced Institute of Science and Technology. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Donggeun Lee. Retrieved from https://idiyas.com/inventor/donggeun-lee-mtkeb5jd

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Donggeun Lee: Innovator in Voltage Measurement Technology

Introduction

Donggeun Lee is a notable inventor based in Daejeon, South Korea. He has made significant contributions to the field of voltage measurement technology. His innovative approach utilizes optical elements to enhance the accuracy and efficiency of voltage measurement devices.

Latest Patents

Donggeun Lee holds 1 patent for his invention titled "Device and method for measuring voltage by using optical element." This patent describes a voltage measuring device that employs a Pockels cell to change the refractive index of incident light based on an applied electric field. The device includes several components, such as non-polarized beam splitters, polarizing plates, light detectors, and a controller that measures voltage based on light intensity detected by the system.

Career Highlights

Throughout his career, Donggeun Lee has worked with prominent organizations, including the Agency for Defense Development and the Korea Advanced Institute of Science and Technology. His work in these institutions has allowed him to develop and refine his innovative technologies.

Collaborations

Donggeun Lee has collaborated with talented individuals such as Sunghoon Hong and Hyun Jong Woo. These partnerships have contributed to the advancement of his research and inventions.

Conclusion

Donggeun Lee's contributions to voltage measurement technology exemplify the impact of innovative thinking in engineering. His patent reflects a significant advancement in the field, showcasing the potential of optical elements in enhancing measurement accuracy.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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