HsinChu, Taiwan

Dong-Zhen Li

This inventor holds 1 USPTO granted patent. Top assignee: Realtek Semiconductor Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dong-Zhen Li. Retrieved from https://idiyas.com/inventor/dong-zhen-li

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Innovations of Dong-Zhen Li in Circuit Testing Technology.

Introduction

Dong-Zhen Li is a notable inventor based in HsinChu, Taiwan. He has made significant contributions to the field of circuit testing technology. His innovative work focuses on enhancing the reliability and efficiency of electronic circuits.

Latest Patents

Dong-Zhen Li holds a patent for a "Scan clock gating controller and method for performing stuck-at fault test among multiple block circuits." This invention provides a scan clock gating controller that includes a decoder and multiple clock gating circuits. The decoder generates multiple one-hot control signals based on a selection signal. The clock gating circuits produce final scan clocks for various block circuits, enabling effective testing for faults.

Career Highlights

Dong-Zhen Li is currently employed at Realtek Semiconductor Inc., a leading company in the semiconductor industry. His work at Realtek has allowed him to apply his innovative ideas in practical applications, contributing to advancements in electronic design and testing.

Collaborations

One of his notable collaborators is Ying-Yen Chen, with whom he has worked on various projects related to circuit technology.

Conclusion

Dong-Zhen Li's contributions to circuit testing technology through his innovative patent demonstrate his expertise and commitment to advancing the field. His work continues to influence the development of reliable electronic systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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