Seongnam-si, South Korea

Dong Won Yun

This inventor holds 1 USPTO granted patent. Top assignee: G2touch Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dong Won Yun. Retrieved from https://idiyas.com/inventor/dong-won-yun-angtuij5

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Dong Won Yun - Innovator in Touch Panel Technology

Introduction

Dong Won Yun is a notable inventor based in Seongnam-si, South Korea. He has made significant contributions to the field of touch panel technology. His innovative approach has led to the development of a unique touch panel design that enhances user experience.

Latest Patents

Dong Won Yun holds a patent for a "Touch panel with compensation touch sensor pattern and compensation driving method thereof." This invention includes a touch panel featuring a matrix of touch sensors arranged in rows and columns. It incorporates upper and lower compensation touch sensors that improve the touch sensitivity of the uppermost and lowermost sensors in the array. This advancement is crucial for enhancing the overall performance of touch panels in various applications.

Career Highlights

Dong Won Yun is currently associated with G2touch Co., Ltd., where he continues to innovate in the field of touch technology. His work has been instrumental in developing solutions that address common challenges in touch panel functionality.

Collaborations

He collaborates with talented individuals in his field, including his coworker Hong Geun Ji, to further enhance the capabilities of touch panel technology.

Conclusion

Dong Won Yun's contributions to touch panel technology exemplify the spirit of innovation. His patent and ongoing work at G2touch Co., Ltd. highlight his commitment to improving user interaction with technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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