Nashua, NH, United States of America

Dong-Pei Chen

This inventor holds 2 USPTO granted patents. Top assignee: Delaware Capital Formation, Inc.. Active years: 2009-2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dong-Pei Chen. Retrieved from https://idiyas.com/inventor/dong-pei-chen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 14(Granted Patents)


Company Filing History:


Years Active: 2009-2011

Loading Chart...
2 patents (USPTO):Explore Patents

Title: Innovations by Dong-Pei Chen

Introduction

Dong-Pei Chen is a notable inventor based in Nashua, NH (US). He has made significant contributions to the field of sensor technology, holding a total of 2 patents. His work focuses on innovative sensor arrays that enhance the measurement of acoustic energy.

Latest Patents

Dong-Pei Chen's latest patents include the development of reflective and slanted array channelized sensor arrays. These inventions utilize a broadband source to provide acoustic energy to a reflective or slanted array. The technology allows for the reflection of a portion of the incident signal to one or more sensing films, where the response is measured. This advancement has the potential to improve the accuracy and efficiency of various sensing applications.

Career Highlights

Dong-Pei Chen is currently employed at Delaware Capital Formation, Inc. His role at the company allows him to further explore and develop his innovative ideas in sensor technology. His contributions have been instrumental in advancing the capabilities of sensor systems.

Collaborations

Some of his notable coworkers include Jeffrey C. Andle and Daniel Scott Stevens. Their collaboration has fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Dong-Pei Chen's work exemplifies the spirit of innovation in sensor technology. His patents reflect a commitment to enhancing measurement techniques, which can have a lasting impact on various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…