Tsukuba, Japan

Dong Ku Kim

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dong Ku Kim. Retrieved from https://idiyas.com/inventor/dong-ku-kim-td9ff0yy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:

goldMedal1 out of 834,601 
Other
 patents

Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Innovations of Dong Ku Kim

Introduction

Dong Ku Kim is a notable inventor based in Tsukuba-shi, Ibaraki, Japan. He has made significant contributions to the field of science and technology, particularly with his innovative approaches to transmembrane trapping methods. His work has garnered attention for its potential applications in various industries.

Latest Patents

Dong Ku Kim holds one patent, which focuses on transmembrane trapping methods. This invention showcases his expertise and creativity in developing solutions that address complex challenges in the field.

Career Highlights

Throughout his career, Dong Ku Kim has demonstrated a commitment to advancing technology and innovation. His work has not only contributed to his personal achievements but has also had a broader impact on the scientific community.

Collaborations

He has collaborated with esteemed colleagues, including Hiromitsu Nakauchi and Yukio Nakamura. These partnerships have enriched his research and have led to further advancements in their respective fields.

Conclusion

Dong Ku Kim's contributions to innovation, particularly in transmembrane trapping methods, highlight his role as a significant figure in the scientific community. His work continues to inspire future advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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