Suwon, South Korea

Dong Joon Won

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Samsung Electronics Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dong Joon Won. Retrieved from https://idiyas.com/inventor/dong-joon-won

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Dong Joon Won: Camera Module Innovation

Introduction

Dong Joon Won is an inventor associated with Suwon, South Korea, and Samsung Electronics Ltd. His work includes a patent for a camera module with an adjustable aperture.

Latest Patents

Won is credited with 1 patent: “Camera Module Including Aperture.” The invention describes a lens assembly with at least two blades that define a lens light entrance hole. A blade controller, coupled to a moving drive magnet and the blades, adjusts the hole’s diameter. It does so by controlling the magnet’s movement in response to current applied to a coil positioned in a surrounding frame. The design also includes a fixed drive magnet mounted on the lens assembly body.

Career Highlights

Won’s patent reflects work on camera-module components and mechanisms for controlling the amount of light entering a lens. The disclosed arrangement combines movable aperture blades with magnetic drive components.

Collaborations

Won’s listed coworkers include Seung Hak Lee and Min Ook Kim. The available information does not specify their roles in the patent or their working relationship with Won.

Conclusion

Dong Joon Won’s patent documents an adjustable-aperture camera module developed in connection with Samsung Electronics Ltd., highlighting an approach to controlling light entry through coordinated blades and magnetic components.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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