This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2004.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2004
Title: Dong-il Kwon: Innovator in Mechanical Property Measurement
Introduction
Dong-il Kwon is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of mechanical property measurement through his innovative inventions. His work focuses on developing advanced apparatuses that enhance the accuracy and safety of testing materials.
Latest Patents
Dong-il Kwon holds a patent for an "Apparatus for indentation test and method for measuring mechanical properties using it." This invention relates to a device designed for conducting indentation tests, which are crucial for assessing the mechanical properties of various materials. The apparatus is engineered to measure these properties without the need for compensative experimental constants, thereby simplifying the analysis of measured data. Additionally, it incorporates a sensor that ensures safe control of the indenter movement during testing.
Career Highlights
Throughout his career, Dong-il Kwon has demonstrated a commitment to innovation in the field of material testing. His patent reflects his expertise and dedication to improving measurement techniques. He has successfully developed a solution that addresses common challenges faced in mechanical property testing.
Collaborations
Dong-il Kwon has collaborated with talented individuals in his field, including coworkers Yun-hee Lee and Yeol Choi. Their combined efforts contribute to the advancement of technology in mechanical testing.
Conclusion
In summary, Dong-il Kwon is a distinguished inventor whose work in developing an apparatus for indentation testing has made a significant impact on the field of mechanical property measurement. His innovative approach enhances the safety and accuracy of material testing, showcasing his valuable contributions to the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile