Daejeon, South Korea

Dong-Ho Shin

USPTO Granted Patents = 13 

Average Co-Inventor Count = 4.3

ph-index = 3

Forward Citations = 180(Granted Patents)


Location History:

  • Daejon, KR (2005)
  • Daejeon, KR (2013 - 2023)

Company Filing History:


Years Active: 2005-2023

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13 patents (USPTO):Explore Patents

Title: Innovations of Dong-Ho Shin

Introduction

Dong-Ho Shin is a prominent inventor based in Daejeon, South Korea. He has made significant contributions to the field of electronics and telecommunications, holding a total of 13 patents. His work focuses on advanced technologies that enhance the analysis and measurement of various samples.

Latest Patents

One of his latest patents is a sample analyzer and analyzing method. This invention provides a sample analyzer that includes a first beam source to deliver a first energy beam to a sample and a second beam source for a different energy beam. The analyzer is equipped with a reflected beam sensor to detect the reflected beam and a transmitted beam sensor to measure the transmitted beam. Another notable patent is a method for measuring the depth profile of a particle beam using acoustic signals generated by the particle beam. This method involves placing sensors in specific directions within the human body to detect acoustic signals and calculate the depth profile of the particle beam.

Career Highlights

Dong-Ho Shin works at the Electronics and Telecommunications Research Institute, where he has been instrumental in developing innovative technologies. His expertise in sample analysis and particle beam measurement has positioned him as a leader in his field.

Collaborations

He collaborates with talented coworkers, including Moon Youn Jung and Seunghwan Kim, to further advance their research and development efforts.

Conclusion

Dong-Ho Shin's contributions to the field of electronics and telecommunications through his patents and innovative methods demonstrate his commitment to advancing technology. His work continues to impact various applications in sample analysis and measurement techniques.

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