The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2023

Filed:

Apr. 07, 2020
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Moon Youn Jung, Daejeon, KR;

Won Bae Cho, Daejeon, KR;

Dong Hoon Song, Daejeon, KR;

Dong-Ho Shin, Daejeon, KR;

Sang Kyun Lee, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/17 (2006.01); G01N 21/55 (2014.01); G01N 21/59 (2006.01); G01N 23/06 (2018.01); H01J 37/26 (2006.01);
U.S. Cl.
CPC ...
G01N 21/17 (2013.01); G01N 21/55 (2013.01); G01N 21/59 (2013.01); G01N 23/06 (2013.01); G01N 2021/1761 (2013.01); G01N 2201/06113 (2013.01); H01J 37/26 (2013.01);
Abstract

The present disclosure provides a sample analyzer and an analyzing method thereof. The sample analyzer includes a first beam source configured to provide a first energy beam to a sample, a second beam source configured to provide a second energy beam, which is different from the first energy beam, to the sample, a reflected beam sensor disposed between the second beam source and the sample to detect a reflected beam of the second energy beam, which is reflected by one side of the sample, and a transmitted beam sensor disposed adjacent to the other side of the sample to detect a transmitted beam of the second energy beam.


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