Cheonan, South Korea

Dong Geun Kim

This inventor holds 1 USPTO granted patent. Top assignee: Chung Ang University Industry Academic Cooperation. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dong Geun Kim. Retrieved from https://idiyas.com/inventor/dong-geun-kim-dhl7cl1e

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Innovations of Dong Geun Kim in Object Detection Technology

Introduction

Dong Geun Kim is a notable inventor based in Cheonan-si, South Korea. He has made significant contributions to the field of object detection technology. His innovative work has led to the development of a unique method and apparatus for detecting multiple objects.

Latest Patents

Dong Geun Kim holds a patent for a "Multiple object detection method and apparatus." This invention discloses a method that includes a feature map extraction unit for extracting a plurality of multi-scale feature maps based on an input image. Additionally, it features a fusion unit that generates a multi-scale fusion feature map, incorporating context information by fusing adjacent multi-scale feature maps.

Career Highlights

Dong Geun Kim is affiliated with Chung Ang University Industry Academic Cooperation. His work at this institution has allowed him to engage in cutting-edge research and development in the field of technology.

Collaborations

He has collaborated with notable colleagues, including Joon Ki Paik and Sang Woo Park. Their combined expertise has contributed to advancements in their respective fields.

Conclusion

Dong Geun Kim's innovative contributions to object detection technology highlight his role as a significant inventor in the industry. His work continues to influence advancements in this important area of research.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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