Taejon, South Korea

Dong Chun Lee

This inventor holds 1 USPTO granted patent. Top assignee: Korea Advanced Institute of Science and Technology. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dong Chun Lee. Retrieved from https://idiyas.com/inventor/dong-chun-lee-y8keamp7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 27(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Innovations of Dong Chun Lee in Optical Fiber Sensors

Introduction

Dong Chun Lee is a prominent inventor based in Taejun, South Korea. He has made significant contributions to the field of optical fiber technology, particularly in the development of sensors that monitor structural integrity and measure strain and temperature.

Latest Patents

One of his notable patents is the "Transmission-type extrinsic Fabry-Perot interferometric optical fiber sensor." This invention provides a method for integrity monitoring of structures and measuring strain and temperature. The sensor consists of first and second single-mode optical fibers, a laser device, and an optical detector. An air gap is formed between the two optical fibers within a capillary quartz-glass tube, allowing for precise measurements based on changes in the gap length.

Career Highlights

Dong Chun Lee is affiliated with the Korea Advanced Institute of Science and Technology, where he continues to advance research in optical fiber sensors. His work has garnered attention for its innovative approach to monitoring structural health.

Collaborations

He has collaborated with notable colleagues, including Jung Ju Lee and San Hoon Kim, contributing to various research projects and advancements in the field.

Conclusion

Dong Chun Lee's contributions to optical fiber sensor technology exemplify the innovative spirit of modern inventors. His work not only enhances our understanding of structural integrity but also paves the way for future advancements in sensor technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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