Lancaster, PA, United States of America

Donald Richard Tshudy

This inventor holds 1 USPTO granted patent. Top assignee: Rca Inc.. Active years: 1977.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Donald Richard Tshudy. Retrieved from https://idiyas.com/inventor/donald-richard-tshudy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1977

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1 patent (USPTO):Explore Patents

Title: Donald Richard Tshudy and Selective Growth of Microcrystalline Silicon.

Introduction

Donald Richard Tshudy was an inventor associated with Lancaster, Pennsylvania. His documented patent describes a method for selectively growing microcrystalline silicon for use in a vidicon target.

Latest Patents

Tshudy’s listed patent, “Method of Selective Growth of Microcrystalline Silicon,” presents a process for forming an array of microcrystalline silicon pads. The method uses hydrogen reduction of silicon tetrachloride to grow silicon on portions of a silicon wafer exposed through openings in an overlying silicon dioxide layer. It is designed to prevent unwanted, irregular silicon growth on the dioxide layer between adjacent pads. Tshudy is credited with 1 patent.

Career Highlights

Tshudy’s recorded work connects him with RCA Inc., a company known for its contributions to electronics and technology. His patent reflects an effort to improve the controlled fabrication of silicon structures for electronic imaging applications.

Collaborations

The patent record identifies Thomas William Edwards as a coworker associated with Tshudy.

Conclusion

Donald Richard Tshudy’s documented contribution is a selective silicon-growth method intended to produce more precisely formed microcrystalline silicon pads for a vidicon target.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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