Tamaqua, PA, United States of America

Donald R Rummel

This inventor holds 1 USPTO granted patent. Top assignee: Sara Lee Corporation. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Donald R Rummel. Retrieved from https://idiyas.com/inventor/donald-r-rummel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Donald R. Rummel and His Cotton Jersey Fabric Innovation.

Introduction

Donald R. Rummel is an inventor associated with Tamaqua, Pennsylvania, and Sara Lee Corporation. His patent work focused on improving the stretch characteristics of cotton jersey fabric by combining cotton and polyester yarns.

Latest Patents

Rummel is credited with 1 patent: “Cotton Jersey Fabric Construction Having Improved Stretch Characteristics.” The invention describes a knitted fabric made from cotton and synthetic polyester yarns. Its construction uses courses of cotton yarn, with polyester yarn knitted into at least every fourth cotton-yarn course to improve the fabric’s stretch characteristics.

Career Highlights

Rummel’s recorded patent reflects work on textile construction and the use of blended yarns to achieve specific fabric properties. His association with Sara Lee Corporation connects this innovation to the company’s work in textiles and consumer products.

Collaborations

Rummel’s listed coworkers include Robert A. Miller III and Joseph D. Atkins. Their names provide context for the professional network associated with his work.

Conclusion

Donald R. Rummel’s patent documents a practical textile innovation that combines cotton and polyester yarns in a knitted structure to improve stretch.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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