Elkhart, IN, United States of America

Donald R Hesser

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Bayer Healthcare LLC. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Donald R Hesser. Retrieved from https://idiyas.com/inventor/donald-r-hesser

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: The Innovations of Donald R Hesser

Introduction

Donald R Hesser is an accomplished inventor based in Elkhart, IN (US). He is known for his innovative contributions to the field of optical inspection apparatuses. His work has led to the development of a unique patent that enhances the efficiency of liquid sample inspections.

Latest Patents

Hesser holds a patent for a "Tray assembly for optical inspection apparatus." This invention features a support tray that can be inserted into an inspection location within a liquid sample inspection apparatus. The design allows a light source to illuminate the liquid sample on the support tray, while a detector captures the light from the sample. The tray includes an insert with two distinct surfaces, each designed to accommodate different types of liquid carriers.

Career Highlights

Throughout his career, Donald R Hesser has worked with notable companies such as Bayer Healthcare LLC and Siemens Healthcare Diagnostics GmbH. His experience in these organizations has contributed significantly to his expertise in the field of healthcare technology and optical inspection.

Collaborations

Hesser has collaborated with several professionals in his field, including David A Brock and Gary H Krauth. These partnerships have fostered innovation and development in his projects.

Conclusion

Donald R Hesser's contributions to the field of optical inspection apparatuses demonstrate his commitment to innovation and excellence. His patent and career achievements reflect his significant impact on the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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