Switzerland, Switzerland

Donald James Weir

This inventor holds 1 USPTO granted patent. Top assignee: Eev Limited. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Donald James Weir. Retrieved from https://idiyas.com/inventor/donald-james-weir

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: The Innovations of Donald James Weir

Introduction

Donald James Weir is a notable inventor based in Switzerland, recognized for his contributions to the field of analyte identification. With a focus on innovative methodologies, Weir has made significant strides in enhancing the accuracy and efficiency of analyte detection.

Latest Patents

Weir holds a patent for a "Method of identifying analytes," which showcases his expertise in developing advanced techniques for chemical analysis. This patent reflects his commitment to pushing the boundaries of scientific research and practical applications.

Career Highlights

Throughout his career, Weir has been associated with Eev Limited, where he has played a pivotal role in driving innovation. His work at the company has positioned him as a key figure in the development of new technologies aimed at improving analyte identification processes.

Collaborations

Weir has collaborated with esteemed colleagues such as Neville John Freeman and Iain Peter May. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and the advancement of technology.

Conclusion

Donald James Weir's contributions to the field of analyte identification exemplify his dedication to innovation and scientific progress. His work continues to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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