Norfolk, MA, United States of America

Donald Heckathorn

This inventor holds 2 USPTO granted patents. Top assignee: Northrop Grumman Systems Corporation. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Donald Heckathorn. Retrieved from https://idiyas.com/inventor/donald-heckathorn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2010

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2 patents (USPTO):Explore Patents

Title: The Innovations of Donald Heckathorn

Introduction

Donald Heckathorn is an accomplished inventor based in Norfolk, MA (US). He holds a total of 2 patents that showcase his expertise in environmental technology. His work has contributed significantly to advancements in determining environmental characteristics.

Latest Patents

Heckathorn's latest patents focus on environmental characteristic determination. In one example, a processor of an apparatus makes a determination of an environmental characteristic based on an average of a plurality of concomitant values that correspond to the environmental characteristic. This innovative approach enhances the accuracy and reliability of environmental assessments.

Career Highlights

Heckathorn is currently employed at Northrop Grumman Systems Corporation, where he applies his skills and knowledge to develop cutting-edge technologies. His contributions to the field have been recognized and valued within the organization.

Collaborations

Some of his notable coworkers include Christopher I Reynolds and Michael S Perlmutter. Their collaborative efforts have further enriched the innovative environment at Northrop Grumman.

Conclusion

Donald Heckathorn's work exemplifies the spirit of innovation in environmental technology. His patents and contributions continue to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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