Company Filing History:
Years Active: 2001-2002
Title: Innovations by Donald Cheng in Electromigration and Dielectric Thin Film Testing
Introduction
Donald Cheng is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor reliability testing, particularly in electromigration and dielectric thin films. With a total of 2 patents, his work has advanced the methodologies used in these critical areas of technology.
Latest Patents
Cheng's latest patents include a method of testing electromigration lifetime and a reliability testing method for dielectric thin films. The method of testing electromigration lifetime involves several steps, including a pre-characterizing phase to obtain essential parameters such as critical temperature, critical line width, and activation energies for grain boundary and lattice diffusion. This innovative approach allows for a more efficient testing process, significantly reducing the time required to obtain results.
The reliability testing method for dielectric thin films employs an exponential current ramp test with a delay time. This method calculates the charge-to-breakdown distribution and assesses the reliability of the dielectric thin film by comparing the results against specified constants. These patents reflect Cheng's commitment to enhancing the reliability and efficiency of semiconductor technologies.
Career Highlights
Donald Cheng is currently employed at United Microelectronics Corporation, a leading company in the semiconductor industry. His work at UMC has positioned him as a key player in the development of advanced testing methodologies. Cheng's expertise in electromigration and dielectric thin films has made him a valuable asset to his team and the broader field of semiconductor research.
Collaborations
Cheng collaborates with several talented individuals, including Kuan-Yu Fu and Chuan H Liu. These collaborations have fostered an environment of innovation and have contributed to the successful development of new testing methodologies.
Conclusion
Donald Cheng's contributions to the field of semiconductor reliability testing are noteworthy. His innovative patents and work at United Microelectronics Corporation demonstrate his dedication to advancing technology in this critical area. His efforts continue to influence the industry and improve the reliability of semiconductor devices.