North Canton, OH, United States of America

Donald C Langley

This inventor holds 1 USPTO granted patent. Top assignee: The Babcock & Wilcox Company. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Donald C Langley. Retrieved from https://idiyas.com/inventor/donald-c-langley

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: Donald C. Langley and Boiler Emissions Control

Introduction

Donald C. Langley is an inventor associated with North Canton, Ohio, and The Babcock & Wilcox Company. His patent work addresses reducing nitrogen oxide emissions from boilers by controlling where an inhibiting reagent is injected into flue gas.

Latest Patents

Langley is credited with 1 patent: “Method and Apparatus for Injecting NOx Inhibiting Reagent into the Flue.” The invention describes a conduit and nozzle that inject reagent into the flue gas within a temperature range suitable for reducing NOx emissions. A sensor near the nozzle measures the gas temperature, while a controlled drive moves the nozzle to the appropriate temperature window. The method is intended for package, utility, and industrial boilers.

Career Highlights

Langley’s listed patent reflects work on emissions-control technology for boiler systems. By combining temperature sensing with adjustable reagent injection, the invention aims to help target treatment where it can reduce NOx emissions.

Collaborations

Langley’s listed coworker is Richard C. Vetterick, Sr. Both are associated with The Babcock & Wilcox Company in the provided information.

Conclusion

Donald C. Langley’s patent describes a temperature-guided approach to reagent injection that supports efforts to reduce nitrogen oxide emissions from boiler flue gas.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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