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For the Inventor, By the Inventor

Wappingers Falls, NY, United States of America

Donald C Forslund

This inventor holds 6 USPTO granted patents. Top assignee: International Business Machines Corporation. Active years: 1993-1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Donald C Forslund. Retrieved from https://idiyas.com/inventor/donald-c-forslund

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 6

% Patents Active = 100.0

Average Co-Inventor Count = 1.4

ph-index = 5

Forward Citations = 70(Granted Patents)


Location History:

  • Wappingers, NY (US) (1993)
  • Wappingers Falls, NY (US) (1993 - 1997)

Company Filing History:

goldMedal6 out of 166,409 
 
International Business Machines Corporation
 patents

Years Active: 1993-1997

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6 patents (USPTO):Explore Patents
1. 5690784 - Ion milling end point detection method and apparatus (1997-11-25),
2. 5659630 - Advanced manufacturing inspection system (1997-08-19),
3. 5544338 - Apparatus and method for raster generation from sparse area array output (1996-08-06),
4. 5455899 - High speed image data processing circuit (1995-10-03),
5. 5257325 - Electronic parallel raster dual image registration device (1993-10-26),
6. 5237626 - Universal image processing module (1993-08-17),

Title: Innovator Spotlight: Donald C. Forslund

Introduction: Donald C. Forslund, based in Wappingers Falls, NY, is a prolific inventor with a remarkable portfolio of six patents. His contributions to the field of manufacturing and inspection technologies demonstrate a commitment to innovation, particularly in the areas of ion milling and advanced inspection systems.

Latest Patents: Forslund's latest significant patents encompass two critical inventions. The first is an **ion milling end point detection method and apparatus**, which features a unique technique for etching coated substrates. This invention utilizes light measurements from a monitor substrate, allowing operators to determine the endpoint of the milling process with precision. Forslund's second patent, the **advanced manufacturing inspection system**, revolutionizes product inspection by employing a database of rasterized reference images for accurate defect detection. This flexible system ensures high-quality production by efficiently aligning reference data with inspection outputs.

Career Highlights: Forslund has spent a notable part of his career at the International Business Machines Corporation (IBM), renowned for its contributions to technological advancements. His role at IBM allows him to harness cutting-edge technologies and participate in the development of innovative solutions that enhance manufacturing processes.

Collaborations: Throughout his professional journey, Forslund has collaborated with esteemed colleagues such as Hans-Juergen Muenster and Mark Allan Casparian. Together, they have pooled their expertise to push the boundaries of technology and improve manufacturing inspection systems.

Conclusion: Donald C. Forslund stands as a testament to the power of innovation within the manufacturing industry. His patents not only reflect his technical skills but also his vision for more efficient and effective manufacturing processes. As his work continues to impact the field, Forslund's legacy as an inventor will undoubtedly inspire future generations of innovators.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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