Company Filing History:
Years Active: 1998
Title: The Innovative Contributions of Donald A. Rogowski
Introduction
Donald A. Rogowski is a notable inventor based in Plano, Texas. He has made significant contributions to the field of thermal imaging systems. With a total of 2 patents, his work has advanced the technology used in thermal imaging applications.
Latest Patents
Rogowski's latest patents include the "Reduced stress electrode for focal plane array of thermal imaging system" and "Reduced stress focal plane array for thermal imaging system and method." The first patent describes a focal plane array that includes thermal sensitive elements bounded by a border. These thermal sensors provide a signal output representative of the thermal radiation incident to the array. A multi-layer common electrode is coupled to the thermal sensitive elements and the border, with an optical coating sensitive to infrared radiation. The second patent elaborates on a similar focal plane array, detailing the arrangement of slots that form the thermal sensitive elements. This design also incorporates a common electrode and an optical coating, enhancing the functionality of thermal imaging systems.
Career Highlights
Donald A. Rogowski is currently employed at Texas Instruments Corporation, where he continues to innovate in the field of thermal imaging technology. His work has been instrumental in developing advanced systems that improve the accuracy and efficiency of thermal imaging applications.
Collaborations
Rogowski collaborates with John P. Long, contributing to the innovative projects at Texas Instruments Corporation. Their combined expertise enhances the development of cutting-edge thermal imaging technologies.
Conclusion
Donald A. Rogowski's contributions to thermal imaging technology through his patents and work at Texas Instruments Corporation highlight his role as a significant inventor in this field. His innovative designs continue to shape the future of thermal imaging systems.