The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 1998
Filed:
Apr. 09, 1997
Applicant:
Inventors:
John P Long, Garland, TX (US);
Donald A Rogowski, Plano, TX (US);
Assignee:
Texas Instruments Incorporated, Dalls, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
250332 ; 250349 ;
Abstract
A focal plane array (30) for a thermal imaging system (20). The focal plane array (30) may include a number of thermal sensitive elements (42) bounded by a border (41). The thermal sensors (40) may provide a sensor signal output representative of the thermal radiation incident to the focal plane array (30). A multi-layer common electrode (36) may be coupled to the thermal sensitive elements (42) and the border (41). An optical coating (34) sensitive to infrared radiation may be provided in communication with the common electrode (36).