Loanhead, United Kingdom

Donald A Longmuir

This inventor holds 1 USPTO granted patent. Top assignee: Ferranti Plc. Active years: 1981.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Donald A Longmuir. Retrieved from https://idiyas.com/inventor/donald-a-longmuir

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1981

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1 patent (USPTO):Explore Patents

Title: The Innovations of Donald A Longmuir

Introduction

Donald A Longmuir is a notable inventor based in Loanhead, GB. He has made significant contributions to the field of circuit testing, particularly in the context of thin film modules. His innovative approach has led to the development of a patented technology that enhances the testing process for electronic components.

Latest Patents

Donald A Longmuir holds a patent for the "Testing of Circuit Arrangements." This patent focuses on the testing of thin film modules by employing predetermined test procedures. The methodology ensures that the analysis of results is facilitated, with test signals supplied to and output signals received from the module terminals. A predetermined interface printed circuit board is connected to these terminals, which helps to prevent electrical and mechanical damage to the module during testing procedures.

Career Highlights

Longmuir is associated with Ferranti Plc, a company known for its advancements in technology and engineering. His work at Ferranti has allowed him to apply his innovative ideas in a practical setting, contributing to the company's reputation for excellence in electronic solutions.

Collaborations

One of his notable collaborators is John M Morrison. Together, they have worked on various projects that leverage their expertise in circuit testing and electronic engineering.

Conclusion

Donald A Longmuir's contributions to the field of circuit testing exemplify the impact of innovation in technology. His patent and work at Ferranti Plc highlight the importance of developing efficient testing procedures for electronic components.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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