Middletown, OH, United States of America

Don L Conn

This inventor holds 1 USPTO granted patent. Top assignee: Armco Steel Corporation. Active years: 1979.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Don L Conn. Retrieved from https://idiyas.com/inventor/don-l-conn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 27(Granted Patents)


Company Filing History:


Years Active: 1979

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1 patent (USPTO):Explore Patents

Title: Don L Conn - Innovator in Ultrasonic Technology

Introduction

Don L Conn is a notable inventor based in Middletown, OH (US). He has made significant contributions to the field of ultrasonic technology, particularly in the calibration of ultrasonic flaw detection test equipment. His innovative approach has led to the development of a unique reference standard that enhances the accuracy and reliability of ultrasonic testing.

Latest Patents

Don L Conn holds a patent for an "Ultrasonic reference standard and the methods of construction and use." This patent describes a reference standard designed for calibrating ultrasonic flaw detection test equipment. The standard consists of a solid body with a surface that engages with the test equipment and a void of known dimensions located within the body. This design allows for precise calibration and improved testing accuracy.

Career Highlights

Throughout his career, Don L Conn has been associated with Armco Steel Corporation, where he has applied his expertise in ultrasonic technology. His work has focused on developing methods that enhance the performance of ultrasonic testing equipment, making significant strides in the industry.

Collaborations

Due to space constraints, the details of collaborations will not be included.

Conclusion

Don L Conn's contributions to ultrasonic technology through his innovative patent have established him as a key figure in the field. His work continues to influence the calibration processes in ultrasonic testing, ensuring greater accuracy and reliability in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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