McLean, VA, United States of America

Don E Krueger, Jr


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 129(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: Don E Krueger, Jr: Innovator in Measurement Sensitivity

Introduction

Don E Krueger, Jr is an accomplished inventor based in McLean, VA (US). He has made significant contributions to the field of measurement sensitivity, particularly in the context of LED and near-infrared instruments. His innovative approach has led to the development of a unique patent that enhances the performance of analytical instruments.

Latest Patents

Krueger holds a patent for a "Low cost means for increasing measurement sensitivity in LED/IRED." This invention discloses a method for modifying the driving current supplied to each IRED based on the opacity of the sample being measured. The current modification means is integrated into the processing system and includes a mechanism for measuring signal levels at an analog-to-digital converter. By adjusting the driving current to each IRED to a maximum value without causing saturation, the instrument achieves high resolution without the need for costly electronic components. Additionally, the system generates and stores an optical signature of the user, further ensuring measurement accuracy.

Career Highlights

Krueger has dedicated his career to advancing measurement technologies. His work at Futrex, Inc. has been pivotal in developing cost-effective solutions for enhancing measurement sensitivity. His innovative mindset and technical expertise have positioned him as a key figure in the industry.

Collaborations

One of his notable collaborators is Robert D Rosenthal. Their partnership has contributed to the successful development and implementation of advanced measurement technologies.

Conclusion

Don E Krueger, Jr is a notable inventor whose work has significantly impacted the field of measurement sensitivity. His innovative patent demonstrates his commitment to enhancing analytical instruments while maintaining cost-effectiveness.

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