Gerbrunn, Germany

Dominik Stich



 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Dominik Stich: Innovator in Terahertz Measurement Technology

Introduction

Dominik Stich is a notable inventor based in Gerbrunn, Germany. He has made significant contributions to the field of measurement technology, particularly with his innovative approach to terahertz measuring devices. His work is characterized by a focus on precision and flexibility in measuring test objects.

Latest Patents

Dominik Stich holds a patent for a terahertz measuring device and method for measuring test objects. This measuring device includes a transmitter-receiver unit and a corresponding mirror arrangement. The mirror arrangement features a first mirror that forms a first focal point and a second focal point in an x-y plane. The first mirror is, at least sectionally, elliptically curved to deflect radiation between the focal points. Additionally, the mirror arrangement includes a second mirror positioned at the first focal point, which is used for deflecting radiation between a z-direction extending transversely to the x-y plane and the x-y plane itself. The test object to be measured is arranged in the region of the second focal point by a test object holder. The radiation reflected on the test object is evaluated by a control unit. This measuring device allows for the simple and flexible measurement of test objects, particularly for measurements over the entire circumference of test objects in the form of plastic pipes with circular cross sections.

Career Highlights

Dominik Stich is currently associated with Inoex GmbH, where he applies his expertise in measurement technology. His role at the company allows him to further develop and refine his innovative ideas, contributing to advancements in the industry.

Collaborations

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Conclusion

Dominik Stich's contributions to terahertz measurement technology exemplify the innovative spirit of modern inventors. His patent reflects a significant advancement in the ability to measure test objects with precision and flexibility.

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