Munich, Germany

Dominik Schild

This inventor holds 1 USPTO granted patent. Top assignee: Texmag Gmbh Vertriebsgesellschaft. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dominik Schild. Retrieved from https://idiyas.com/inventor/dominik-schild

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Dominik Schild: Innovator in Material Sensing Technology

Introduction

Dominik Schild is a notable inventor based in Munich, Germany. He has made significant contributions to the field of material sensing technology. His innovative approach has led to the development of a unique method for sensing markings on running webs of material.

Latest Patents

Dominik Schild holds a patent for a "Method for sensing a marking on a running web of material." This method involves optically scanning the web of material using an image recording device. The process generates image signals in successive measuring cycles, which are then processed to determine the positional values of the marking. A validity signal is produced based on these positional values, indicating whether the determined positional value is valid.

Career Highlights

Dominik Schild is currently employed at Texmag GmbH Vertriebsgesellschaft, where he continues to innovate in his field. His work has garnered attention for its practical applications in material processing and quality control.

Collaborations

He collaborates with talented individuals such as Peter Sander and Juergen Eisen, contributing to a dynamic work environment that fosters innovation.

Conclusion

Dominik Schild's contributions to material sensing technology exemplify the impact of innovative thinking in industrial applications. His patent and ongoing work at Texmag GmbH highlight his role as a key figure in advancing this important field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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