Frankfurt, Germany

Dominik Olschewski

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Abb Schweiz Ag. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dominik Olschewski. Retrieved from https://idiyas.com/inventor/dominik-olschewski

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Dominik Olschewski: Inventor of a Robot-Cycle Outlier Detection System

Introduction

Dominik Olschewski is an inventor based in Frankfurt, Germany, associated with ABB Schweiz AG. His work includes an invention for detecting outliers in robot-cycle data by using process fingerprints.

Latest Patents

Olschewski is associated with 1 patent: “Outlier Detection Based on Process Fingerprints from Robot Cycle Data.” The invention describes a system that collects cyclic data as vectors representing individual robot cycles and stores that data for processing. When triggered by a cycle-start signal, a data-processing component parses the stored information according to metadata defined in a configuration file and extracts process fingerprints. These fingerprints support the identification of outliers in robot-cycle data.

Career Highlights

Olschewski’s listed patent work is connected to industrial robotics and data analysis. The system’s use of cloud processing and cycle-based data aims to help analyze robot processes and identify unusual patterns.

Collaborations

The provided information lists Kai Merz and Arzam Muzaffar Kotriwala as Olschewski’s coworkers. His patent is associated with ABB Schweiz AG.

Conclusion

Dominik Olschewski’s patent work focuses on applying process fingerprints and cloud-based analysis to outlier detection in robot-cycle data.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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