Wiesbaden, Germany

Dominik Oelke

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent and 1 EPO patent. Top assignee: Smiths Heimann Gmbh. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dominik Oelke. Retrieved from https://idiyas.com/inventor/dominik-oelke

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Dominik Oelke: Innovator in Object Detection Technology

Introduction

Dominik Oelke is a notable inventor based in Wiesbaden, Germany. He has made significant contributions to the field of object detection technology, particularly in the context of luggage security. His innovative approach addresses the challenges of identifying electronic devices within bags, enhancing safety and efficiency in security processes.

Latest Patents

Dominik Oelke holds a patent for a groundbreaking invention titled "Laptop Detection." This patent involves devices, systems, and methods designed for the detection of objects, such as laptop computers, electronics, and explosives, within luggage. The methods outlined in the patent specifically focus on detecting laptop computers amidst other metallic objects and electronic devices, showcasing his expertise in this critical area.

Career Highlights

Oelke is currently associated with Smiths Heimann GmbH, a company known for its advanced security solutions. His role at the company allows him to apply his innovative ideas in practical settings, contributing to the development of state-of-the-art detection systems.

Collaborations

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Conclusion

Dominik Oelke's work in object detection technology exemplifies the impact of innovation on security measures. His patent for laptop detection is a testament to his commitment to enhancing safety in luggage handling.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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