This inventor holds 1 USPTO granted patent. Top assignee: University of Virginia Patent Foundation. Active years: 2009.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2009
Title: Dominick T Montie: Innovator in High Mast Inspection Systems
Introduction
Dominick T Montie is a notable inventor based in Charlottesville, VA (US). He has made significant contributions to the field of inspection systems, particularly with his innovative approach to high mast inspection technology. His work is characterized by a commitment to enhancing safety and efficiency in inspection processes.
Latest Patents
Montie's most recent patent is titled "High Mast Inspection System, Equipment and Method." This invention provides an inspection system that can be removably mounted to a platform, which is movable in relation to a generally upright mast. The system includes a mounting support assembly that is fixable to the platform and carries a detector device for scanning the mast. It also features a power supply and a communications device that relays the collected information, ensuring effective monitoring and maintenance of high masts.
Career Highlights
Montie is associated with the University of Virginia Patent Foundation, where he continues to develop and refine his innovative ideas. His work has led to the creation of practical solutions that address real-world challenges in the inspection of tall structures. With a focus on safety and technological advancement, he has established himself as a key figure in his field.
Collaborations
Some of Montie's notable coworkers include David S Ellis and Pradip N Sheth. Their collaborative efforts contribute to the advancement of technology and innovation within the University of Virginia Patent Foundation.
Conclusion
Dominick T Montie's contributions to high mast inspection systems exemplify the spirit of innovation and dedication to improving safety in engineering practices. His work continues to influence the field and inspire future advancements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
