Pattensen, Germany

Dominic Haerke

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent and 1 EPO patent. Top assignee: Rosenberger Hochfrequeńztechnik Gmbh & Co. Kg. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dominic Haerke. Retrieved from https://idiyas.com/inventor/dominic-haerke

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0


 

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Dominic Haerke

Introduction

Dominic Haerke is a notable inventor based in Pattensen, Germany. He has made significant contributions to the field of test apparatus calibration. His innovative approach has led to the development of a unique method that enhances the accuracy of gauging two-port test objects.

Latest Patents

Dominic holds a patent for a "Method for calibrating a test rig." This method involves a sophisticated calibration process using a vectorial network analyzer connected to directional couplers. The calibration technique allows for the determination of scatter parameters and corrections to the scatter matrix, ultimately improving the precision of measurements in electromagnetic wave applications.

Career Highlights

Dominic Haerke is associated with Rosenberger Hochfrequenztechnik GmbH & Co. KG, a company renowned for its expertise in high-frequency technology. His work at the company has been instrumental in advancing calibration methods and enhancing the performance of test apparatuses.

Collaborations

Dominic collaborates with Christian Zietz, a fellow professional in the field. Their partnership has fostered innovation and contributed to the development of advanced calibration techniques.

Conclusion

Dominic Haerke's contributions to the field of test apparatus calibration exemplify the spirit of innovation. His patented method showcases his expertise and commitment to enhancing measurement accuracy in high-frequency technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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