Cedar Grove, NJ, United States of America

Doan Lieu

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Basf Corporation. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Doan Lieu. Retrieved from https://idiyas.com/inventor/doan-lieu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Doan Lieu: Innovator in Catalyst Technology

Introduction

Doan Lieu is an accomplished inventor based in Cedar Grove, NJ (US). He has made significant contributions to the field of catalyst technology, particularly in the development of hollow porous metal oxide microspheres.

Latest Patents

Doan Lieu holds a patent for a "Hollow microsphere catalyst support and methods of making same." This innovative patent describes the creation of hollow porous metal oxide microspheres that serve as a support for catalysts, especially for exhaust treatment in internal combustion engines. The patent also outlines various methods for producing these microspheres and utilizing them in exhaust treatment applications.

Career Highlights

Doan Lieu is currently employed at BASF Corporation, a leading global chemical company. His work focuses on advancing catalyst technologies that contribute to cleaner and more efficient combustion processes.

Collaborations

Doan collaborates with talented colleagues, including Pascaline Tran and Michael P Galligan, who contribute to the innovative environment at BASF Corporation.

Conclusion

Doan Lieu's work in catalyst technology exemplifies the importance of innovation in addressing environmental challenges. His contributions through patents and collaboration with skilled professionals continue to drive advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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