Moscow, Russia

Dmitry Yurjevich Sokolov

This inventor holds 4 USPTO granted patents. Top assignees: Chastnoe Uchrezhdenie “Nazarbayev University Research and Innovation System”, K.w. Muth Company, Inc., Nazarbayev University Research and Innovation System. Active years: 2006-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dmitry Yurjevich Sokolov. Retrieved from https://idiyas.com/inventor/dmitry-yurjevich-sokolov

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 25.0

Average Co-Inventor Count = 4.2

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2006-2022

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4 patents (USPTO):Explore Patents

Title: Dmitry Yurjevich Sokolov: Innovator in Scanning Probe Technology

Introduction

Dmitry Yurjevich Sokolov is a prominent inventor based in Moscow, Russia. With a focus on advancements in probe measurements, he has been recognized for his innovative contributions to the field, holding four patents to his name. His work continues to push the boundaries of measurement technology, particularly in the micro- and nano-scale domains.

Latest Patents

Sokolov's latest patents display his commitment to enhancing measurement resolution and functional capabilities within scanning technology. One of his notable inventions is a "Wide-field scanning probe microscope combined with an apparatus for modifying an object." This invention simplifies the structure of measurement devices, integrating measuring and modifying capabilities within a unified framework. It features a piezo-scanner unit, a probe unit, and a punch unit that facilitates high-resolution measurements in micro- and nano-sectioning processes.

Another significant patent is the "Scanning probe nanotomograph comprising an optical analysis module." This innovative invention enhances the functional capabilities of traditional scanning probe systems by introducing an optical analysis module that allows for concurrent optical observation and study of objects during sectioning. This remarkable advancement not only broadens the analytical scope of such apparatuses but also boosts their measurement efficiency.

Career Highlights

Throughout his career, Sokolov has collaborated with reputable organizations, contributing to cutting-edge research and development. He has been associated with the International Business Machines Corporation (IBM) and Nazarbayev University Research and Innovation System, where he has been instrumental in pushing forward innovative projects and technological solutions.

Collaborations

Sokolov has worked alongside distinguished colleagues, including Alexander Mihaylovich Alekseev and Aleksey Dmitrievich Volkov. This collaboration has enriched his research endeavors, leading to significant breakthroughs in scanning probe technology and its applications.

Conclusion

Dmitry Yurjevich Sokolov stands out as an influential inventor dedicated to enhancing probe measurement technology. His innovative patents not only contribute to the scientific community but also pave the way for future advancements in the field. Through his collaborations and work, he continues to inspire the next generation of inventors and researchers.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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