Hwaseong, South Korea

Dmitry Aizenshtat

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dmitry Aizenshtat. Retrieved from https://idiyas.com/inventor/dmitry-aizenshtat

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2015

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Dmitry Aizenshtat: Image Sensor Innovation

Introduction

Dmitry Aizenshtat is an inventor associated with Hwaseong, South Korea, and Samsung Electronics Co., Ltd. His patent work concerns image-sensor circuitry and correlated double sampling, a technique used to process signals from image-sensor pixels.

Latest Patents

Aizenshtat is named on 1 patent: “Correlated Double Sampling Device and Image Sensor.” The invention describes a correlated double sampling device for an image sensor with a pixel array. First comparators connect to the array’s columns and compare an analog signal with a ramp signal to generate positive and negative amplified signals. Second and third comparators, connected to different sets of the first comparators, compare those amplified signals and produce comparison signals at specified logic levels.

Career Highlights

Aizenshtat’s listed patent reflects work on comparator-based image-sensor signal processing. The design organizes comparisons across pixel-array columns, supporting the generation of comparison signals within a correlated double sampling device.

Collaborations

The supplied information identifies Claudio Jakobson and Vadim Gelfand as Aizenshtat’s coworkers. It does not specify their roles in the patent or whether they collaborated on this invention.

Conclusion

Dmitry Aizenshtat’s recorded invention focuses on correlated double sampling circuitry for image sensors, with a design that uses multiple comparator groups to process pixel signals.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…